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  1.  25
    An experimental determination of electrical resistivity of dislocations in aluminium.J. G. Rider & C. T. B. Foxon - 1966 - Philosophical Magazine 13 (122):289-303.
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  2.  14
    Systematic errors in dislocation densities measured by thin film electron microscopy.C. T. B. Foxon & J. G. Rider - 1966 - Philosophical Magazine 14 (127):185-187.
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  3.  18
    An experimental determination of the electrical resistivity of dislocations in copper.J. G. Rider & C. T. B. Foxon - 1967 - Philosophical Magazine 16 (144):1133-1138.
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  4.  11
    On dislocation loss in thin film electron microscopy of polycrystalline copper.C. T. B. Foxon & J. G. Rider - 1968 - Philosophical Magazine 17 (148):729-734.
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  5.  14
    Slip in single crystals of mercury.J. G. Rider & F. Heckscher - 1966 - Philosophical Magazine 13 (124):687-692.
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